Tips on the tip of AFM

Developing new instruments to be able to “see” at the nanoscale is a research field in itself. Shown here is the tip of an atomic force microscope (AFM), one of the foremost tools for imaging, measuring and manipulating matter at the nanoscale. Here, a platinum electrode measuring one hundredth of a nanometer has been deposited on the tip of this pyramid shaped AFM tip via focused ion beam (FIB) deposition.


Carbon Nanotube Photodetector – Isis Project No 8486

Carbon nanotube based photodetector with broad range of optical and near infrared operational frequencies, demonstrating very high quantum efficiency and rapid response.

Read more….


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